ISO 11938:2012 PDF
Original price was: $65.00.$50.70Current price is: $50.70.
Microbeam analysis — Electron probe microanalysis — Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
This International Standard provides procedures for electron microprobe elemental-mapping analysis using
wavelength-dispersive spectrometry. The choice between mapping with the electron beam moving digitally
across the specimen (electron beam mapping) and mapping with stage movement only (large-area mapping) is
assessed. It describes five types of data processing: the raw X-ray intensity data method, the k-value method,
the calibration method, the correlation method and the matrix correction method.
| Edition | 2012 |
|---|---|
| Published Date | 2012 |
| Published By | International Standardization Organisation |
| Page Count | 10 |
