ISO/TS 10867:2010 PDF
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Nanotechnologies — Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy
ISO/TS 10867:2010 provides guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.
ISO/TS 10867:2010 provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNT in a sample and their relative integrated PL intensities.
The method can be expanded to estimate relative mass concentrations of semi-conducting SWCNTs in a sample from measured integrated PL intensities and knowledge of their PL cross-sections.
| Edition | 2010 |
|---|---|
| Published Date | 2010 |
| Published By | ISO/TS |
| Page Count | 14 |
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